High-energy x-ray response of photographic films: models and measurement

Journal Article · Sat Nov 01 04:00:00 EST 1986 · J. Opt. Soc. Am. B: Opt. Phys.; (United States)

DOI:https://doi.org/10.1364/JOSAB.3.001540· OSTI ID:7110566

Henke, B L; Uejio, J Y; Stone, G F; Dittmore, C H; Fujiwara, F G

A detailed characterization has been established for the new, high-sensitivity double-emulsion Kodak Direct Exposure Film (DEF). The experimental data base consisted of density-versus-exposure measurements that were duplicated at several laboratories for x radiations in the 1000-10,000-eV region. The absortpion and geometric properties of the film were determined, which, along with the density-exposure data, permitted the application of a relatively simple analytical model description for the optical density, D, as a function of the intensity, I (photons/..mu..m/sup 2/), the photon energy, E (eV), and the angle of incidence, 0, of the exposing radiation. A detailed table is presented for the I values corresponding to optical densities in the 0.2--2.0 range and to photon energies, E (eV), in the 1000-10,000-eV region. Experimentally derived conversion relations have been obtained that allow the density values to be expressed as either diffuse of specular. Also presented here is a similar characterization of the complementary, single-emulsion x-ray film, Kodak SB-5 (or 392). For the 1000-10,000-eV region this x-ray film is appreciably less sensitive but has higher resolution.

• Research Organization: Lawrence Berkeley Laboratory, University of California, Berkeley California 94720
• OSTI ID: 7110566
• Journal Information: J. Opt. Soc. Am. B: Opt. Phys.; (United States), Journal Name: J. Opt. Soc. Am. B: Opt. Phys.; (United States) Vol. 3:11; ISSN JOBPD
• Country of Publication: United States
• Language: English

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