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Low-energy x-ray response of photographic films. II. Experimental characterization

Journal Article · · J. Opt. Soc. Am. B: Opt. Phys.; (United States)
Optical density versus exposure data have been obtained at nine photon energies in the 100--2000-eV x-ray region for five spectroscopic films (Kodak films 101-07, SB-392, RAR 2492, RAR 2495, and RAR 2497). These data were determined operationally by a direct comparison of the peak absolute intensities of spectral lines, which were measured with a calibrated proportional counter, with the microdensitometer tracings of the corresponding photographically recorded spectral lines. Film-resolution limits were deduced from an analysis of contact microradiograms of linear zone plates constructed of gold bars. The relationship between the specular densities as measured here and the diffuse densities have been experimentally determined for the five films. Finally, experimental measurements of the optical density versus the angle of incidence of exposing radiation of constant intensity were obtained. These data, relating density to the x-ray intensity, its photon energy, and its angle of incidence, are shown to be fitted satisfactorily in the 100--10 000-eV region by the semiempirical mathematical model relations that were derived in Part I of this research (J. Opt. Soc. Am. B 1, 818--827 (1984)).
Research Organization:
University of Hawaii, Honolulu, Hawaii 96822
DOE Contract Number:
AS08-83DP40181
OSTI ID:
6217954
Journal Information:
J. Opt. Soc. Am. B: Opt. Phys.; (United States), Journal Name: J. Opt. Soc. Am. B: Opt. Phys.; (United States) Vol. 1:6; ISSN JOBPD
Country of Publication:
United States
Language:
English