Low-energy x-ray response of photographic films. I. Mathematical models

Journal Article · Sat Dec 01 04:00:00 EST 1984 · J. Opt. Soc. Am. B: Opt. Phys.; (United States)

DOI:https://doi.org/10.1364/JOSAB.1.000818· OSTI ID:6171269

Henke, B L; Kwok, S L; Uejio, J Y; Yamada, H T; Young, G C

Relatively simple mathematical models are developed to determine the optical density as a function of the x-ray intensity, its angle of incidence, and its photon energy in the 100--10,000-eV region for monolayer and emulsion types of photographic films. Semiempirical relations are applied to characterize a monolayer film (Kodak 101-07) and an emilsion-type film (Kodak RAR 2497); these relations fit calibration data at nine photon energies well within typical experimental error.

• Research Organization: University of Hawaii, Honolulu, Hawaii 96822
• OSTI ID: 6171269
• Journal Information: J. Opt. Soc. Am. B: Opt. Phys.; (United States), Journal Name: J. Opt. Soc. Am. B: Opt. Phys.; (United States) Vol. 1:6; ISSN JOBPD
• Country of Publication: United States
• Language: English

Related Subjects

440300* -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
ABSORPTIVITY
AMPLITUDES
BROMIDES
BROMINE COMPOUNDS
CALIBRATION
COLLOIDS
DATA
DETECTION
DISPERSIONS
EFFICIENCY
ELECTRON MICROSCOPY
EMULSIONS
FLUX DENSITY
HALIDES
HALOGEN COMPOUNDS
INCIDENCE ANGLE
INFORMATION
MATHEMATICAL MODELS
MEASURING INSTRUMENTS
MICROSCOPY
NUMERICAL DATA
OPACITY
OPTICAL PROPERTIES
PHOTOGRAPHIC EMULSIONS
PHOTOGRAPHIC FILM DETECTORS
PHOTOGRAPHIC FILMS
PHOTOSENSITIVITY
PHYSICAL PROPERTIES
PLASMA DIAGNOSTICS
POSITION SENSITIVE DETECTORS
RADIANT FLUX DENSITY
RADIATION DETECTION
RADIATION DETECTORS
SCANNING ELECTRON MICROSCOPY
SENSITIVITY
SILVER BROMIDES
SILVER COMPOUNDS
SPECTRAL RESPONSE
SPECTROMETERS
THEORETICAL DATA
TRANSITION ELEMENT COMPOUNDS
X-RAY DETECTION
X-RAY SPECTROMETERS