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Critical magnetic fields of ultrathin bismuth films

Journal Article · · Sov. J. Low Temp. Phys. (Engl. Transl.); (United States)
OSTI ID:7097214
Critical transverse magnetic fields were measured in bismuth films 70 to 18 A thick. It was found that for the temperature range (5--1.8/sup 0/K) and fields investigated the relation H/sub C/(T) is linear in bismuth layers freshly condensed on a liquid-helium-cooled substrate. The slope dH/sub c//dT increases the film thickness decreases, attaining a value of 95,000 Oe/deg for the thinnest films. This increase is correlated with the increase in film resistivity, i.e., with the reduction in the mean free path of the conduction-band electrons. The value of the factor A obtained from the value of the critical magnetic field for a film about 20 A thick (H/sub C/ =Ax10/sup 4/ T/sub C/) is 9.5. Thus, in ultrathin bismuth films the critical magnetic field is much higher than the paramagnetic limit. This behavior is explained by the large spin--orbit scattering in freshly-deposited ultrathin bismuth films. When the thickness of the bismuth film decreases from 40 to 10 A, the density of states falls off by approximately a factor of two.
Research Organization:
Physicotechnical Institute, Academy of Sciences of the Ukrainian SSR, Khar'kov
OSTI ID:
7097214
Journal Information:
Sov. J. Low Temp. Phys. (Engl. Transl.); (United States), Journal Name: Sov. J. Low Temp. Phys. (Engl. Transl.); (United States) Vol. 3:9; ISSN SJLPD
Country of Publication:
United States
Language:
English

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