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Critical magnetic fields of thin cold-deposited indium films

Journal Article · · Sov. J. Low Temp. Phys. (Engl. Transl.); (United States)
OSTI ID:7026352
The dependence of H/sub c/perpendicular on the resistivity has been studied for the first time in freshly deposited thin (<200 A) indium films evaporated onto a cold substrate. The films were formed under identical conditions and had similar lattice defects. The critical transverse magnetic field for the thinnest (24 A) indium films studied was more than 20 times the known values of the fields. The maximum critical transverse magnetic field of freshly evaporated indium films, according to the experimental data, was 72,000 Oe (H/sub c/perpendicularroughly-equal1.6 x 10/sup 4/ T/sub c/), which is near the paramagnetic limit.
Research Organization:
Physicotechnical Institute, Academy of Sciences of the Ukrainian SSR, Khar'kov
OSTI ID:
7026352
Journal Information:
Sov. J. Low Temp. Phys. (Engl. Transl.); (United States), Journal Name: Sov. J. Low Temp. Phys. (Engl. Transl.); (United States) Vol. 9:10; ISSN SJLPD
Country of Publication:
United States
Language:
English

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