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U.S. Department of Energy
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High-performance InGaAsP/InP buried-heterostructure lasers and arrays defined by ion-beam-assisted etching

Technical Report ·
OSTI ID:7085600

Ion-beam assisted etching was used to fabricate mass-transported InGaAsP/InP buried-heterostructure lasers. These lasers have a novel, deeply etched rectangular mesa that results in reduced current leakage. Both single-stripe lasers and Y-junction-coupled multiple-stripe laser arrays were demonstrated. The single-stripe lasers have 12-mA c-w threshold currents, differential quantum efficiencies of 32%-34% per facet, and smooth single-lobe far-field patterns. The multiple-stripe arrays lase in-phase with strong phase coherence.

Research Organization:
Massachusetts Inst. of Tech., Lexington (USA). Lincoln Lab.
OSTI ID:
7085600
Report Number(s):
AD-A-194640/9/XAB; JA-6079
Country of Publication:
United States
Language:
English