Using embedded microcontrollers in radar test equipment
With the recent advancements in microcontroller technology, radar test equipment can be designed to improve the accuracy of measurements being made and simplify designs. An embedded integrator monitor design application (hardware and software) is presented and comparisons are made between the embedded design and the more traditional discrete design approach. 23 figs.
- Research Organization:
- Allied-Signal Aerospace Co., Kansas City, MO (USA). Kansas City Div.
- Sponsoring Organization:
- DOE/DP
- DOE Contract Number:
- AC04-76DP00613
- OSTI ID:
- 7065674
- Report Number(s):
- KCP-613-4292; CONF-9005175--2; ON: DE90014997
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
42 ENGINEERING
426000 -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
440800* -- Miscellaneous Instrumentation-- (1990-)
47 OTHER INSTRUMENTATION
99 GENERAL AND MISCELLANEOUS
990200 -- Mathematics & Computers
ACCURACY
BENCHMARKS
COMPUTER ARCHITECTURE
COMPUTERS
DATA PROCESSING
DESIGN
ELECTRONIC CIRCUITS
FLEXIBILITY
MATHEMATICS
MEASURING INSTRUMENTS
MECHANICAL PROPERTIES
MICROELECTRONIC CIRCUITS
MICROPROCESSORS
PERFORMANCE
PROCESSING
RADAR
RANGE FINDERS
REAL TIME SYSTEMS
RELIABILITY
STANDARDIZATION
STATISTICS
TENSILE PROPERTIES
TESTING
426000 -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
440800* -- Miscellaneous Instrumentation-- (1990-)
47 OTHER INSTRUMENTATION
99 GENERAL AND MISCELLANEOUS
990200 -- Mathematics & Computers
ACCURACY
BENCHMARKS
COMPUTER ARCHITECTURE
COMPUTERS
DATA PROCESSING
DESIGN
ELECTRONIC CIRCUITS
FLEXIBILITY
MATHEMATICS
MEASURING INSTRUMENTS
MECHANICAL PROPERTIES
MICROELECTRONIC CIRCUITS
MICROPROCESSORS
PERFORMANCE
PROCESSING
RADAR
RANGE FINDERS
REAL TIME SYSTEMS
RELIABILITY
STANDARDIZATION
STATISTICS
TENSILE PROPERTIES
TESTING