Development of a hard microcontroller

Conference · Wed Dec 01 04:00:00 EST 1976 · IEEE Trans. Nucl. Sci.; (United States)

OSTI ID:7256739

Measel, P R; Sivo, L L; Quilitz, W E; Davidson, T K

The applicability of commercially available microprocessors to certain systems requiring radiation survival was assessed. A microcontroller was designed and built to perform a monitor and control function of military operational ground equipment, and demonstrated to exceed the radiation hardness goal. The preparation of the microcontroller module required hardware and software design, selection of LSI and other piece part types, development of piece part and module electrical and radiation test techniques, and the performance of radiation tests on the LSI piece parts and the completed module. The microcontroller has a 16-bit central processor unit, a 4096 word read only memory, and a 256 word read-write memory. The module has circumvention circuitry, including a PIN diode radiation detector. The processor device used was the MMI 6701 T/sup 2/L Schottky bipolar 4-bit slice. Electrical exerciser circuits were developed for in-situ electrical testing of microprocessors and memories during irradiation. A test program was developed for a Terradyne J283 microcircuit tester for more complete electrical characterization of the MMI 6701 microprocessor. A simple self-test algorithm was used in the microcontroller for performance testing during irradiation. For the operational demonstration of the microcontroller a TI 960A minicomputer was used to provide the required complex inputs to the module and verify the module outputs.

• Research Organization: Boeing Aerospace Co., Seattle
• OSTI ID: 7256739
• Conference Information: Journal Name: IEEE Trans. Nucl. Sci.; (United States) Journal Volume: NS-23:6
• Country of Publication: United States
• Language: English

Related Subjects

440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DOSE RATES
ELECTRONIC CIRCUITS
EQUIPMENT
HARDENING
INTEGRATED CIRCUITS
MICROELECTRONIC CIRCUITS
MICROPROCESSORS
MILITARY EQUIPMENT
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATION HARDENING
TEST FACILITIES
TESTING