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The photoemission spectromicroscope multiple-application x-ray imaging undulator microscope (MAXIMUM)

Journal Article · · Journal of Vacuum Science and Technology, A (Vacuum, Surfaces and Films); (USA)
DOI:https://doi.org/10.1116/1.576736· OSTI ID:7049494
; ; ; ; ; ; ; ;  [1]; ; ;  [2]
  1. Department of Physics, University of Wisconsin, Madison, WI (USA) Department of Electrical and Computer Engineering, University of Wisconsin, Madison, WI (USA) Synchrotron Radiation Center, University of Wisconsin, Madison, WI (USA)
  2. Center for X-Ray Optics, Lawrence Berkeley Laboratory, Berkeley, CA (USA)
We discuss the implementation of phase I of the spectromicroscopy program MAXIMUM (multiple-application x-ray imaging undulator microscope) at the Wisconsin Synchrotron Radiation Center. Successful feasibility tests included taking photoemission micrographs with lateral resolution of a few microns, line scans, knife-edge tests, photon flux measurements, and characterization of the focusing performance.
DOE Contract Number:
AC03-76SF00098
OSTI ID:
7049494
Journal Information:
Journal of Vacuum Science and Technology, A (Vacuum, Surfaces and Films); (USA), Journal Name: Journal of Vacuum Science and Technology, A (Vacuum, Surfaces and Films); (USA) Vol. 8:3; ISSN JVTAD; ISSN 0734-2101
Country of Publication:
United States
Language:
English