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Applications of the X1A scanning photoemission spectromicroscope for element identification on material surfaces

Conference ·
OSTI ID:99511
;  [1];  [2]; ;  [3];  [4]
  1. State Univ. of New York, Stony Brook, NY (United States). Dept. of Physics
  2. North Carolina State University, Raleigh, NC (United States). Dept. of Physics
  3. Brookhaven National Lab., Upton, NY (United States). National Synchrotron Light Source
  4. Lawrence Berkeley Lab., CA (United States). Center for X-ray Optics
+ Show Author Affiliations

The Second Generation Scanning Photoemission Microscope at the beamline X1a of the National Synchrotron Light Source (NSLS), X1A SPEM II, is designed for spatially resolved elemental and chemical analysis by X-ray Photoelectron Spectroscopy (XPS) on material surfaces. Based on Fresnel Zone Plate (ZP) microfocusing techniques with the use of a bright and coherent photon source, this microscope is capable of acquiring XPS spectra from a small area irradiated by the focused beam and taking element-specific (using photopeaks) or chemical-state-specific (by detecting the chemical core level shifts) images with a spatial resolution defined by the focused spot size.

Research Organization:
Brookhaven National Laboratory (BNL), Upton, NY
DOE Contract Number:
AC02-76CH00016; AC03-76SF00098
OSTI ID:
99511
Report Number(s):
CONF-941144--; ISBN 1-55899-277-4
Country of Publication:
United States
Language:
English

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Related Subjects

40 CHEMISTRY
CHEMICAL ANALYSIS
CHEMICAL SHIFT
MEASURING INSTRUMENTS
MICROSCOPES
PHOTOELECTRON SPECTROSCOPY
X RADIATION