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Structure of ultrathin films of Fe on Cu l brace 111 r brace and Cu l brace 110 r brace

Journal Article · · Physical Review, B: Condensed Matter; (United States)
;  [1];  [2]
  1. College of Engineering and Applied Science, State University of New York, Stony Brook, New York 11794 (United States)
  2. IBM Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598 (United States)

A study of the growth of Fe on Cu{l brace}111{r brace} and on Cu{l brace}110{r brace} has been carried out with low-energy electron diffraction (LEED) and Auger electron spectroscopy. We find that on Cu{l brace}111{r brace}, Fe grows first pseudomorphically as {gamma}-Fe{l brace}111{r brace} to a thickness of about five layer equivalents (LE), and then forms six bcc Fe{l brace}110{r brace} domains rotationally related in the Kurdjumov-Sachs orientation. The pseudomorphic film has the same bulk interlayer spacing, within experimental error, as the Cu{l brace}111{r brace} substrate (2.08{plus minus}0.03 A) and a slightly contracted first interlayer spacing (2.03{plus minus}0.03 A). With increasing thickness more and more defects are introduced in the film, but a 13-LE film still produces a good LEED pattern. On Cu{l brace}110{r brace}, the Fe film grows also pseudomorphically, with the same bulk interlayer spacing as the substrate (1.27 A) and a contracted first interlayer spacing (1.17 A), but a precise structure analysis is not possible because the film has relatively large {l brace}111{r brace} facets. Defects and disorder increase with film thickness, so that the LEED pattern is practically obliterated when the thickness exceeds about 20 LE.

DOE Contract Number:
FG02-86ER45239
OSTI ID:
7048900
Journal Information:
Physical Review, B: Condensed Matter; (United States), Journal Name: Physical Review, B: Condensed Matter; (United States) Vol. 45:19; ISSN 0163-1829; ISSN PRBMD
Country of Publication:
United States
Language:
English

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