Growth of ultrathin films of Fe on Au[l brace]001[r brace]
- College of Engineering and Applied Science, State University of New York, Stony Brook, New York 11794-2275 (United States)
- Laboratory for Surface Studies, Physics Department, University of Wisconsin, Milwaukee, Wisconsin 53201 (United States)
- IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598 (United States)
The crystallographic aspects of the growth of ultrathin films of Fe on Au[l brace]001[r brace] are studied by means of quantitative low-energy electron diffraction (LEED) and Auger electron spectroscopy (AES). The first monolayer of Fe is found to be pseudomorphic to the Au[l brace]001[r brace] substrate with an interlayer spacing of 1.825 A, and to be covered by a monolayer of Au at an interlayer distance of 1.85 A, which acts as a surfactant. Thicker films of Fe [up to 45 layer equivalents (LE)] may be pseudomorphic and hence slightly strained (the lattice misfit is 0.6%) or equilibrium bcc with surface relaxation (the present analysis cannot distinguish between the two possibilities), but contain defects and disordered steps. Gold atoms are found to be segregated in the surface region of 45-LE Fe films, but mostly in a disordered arrangement. A comparison between the results obtained with two different computer programs for the calculation of LEED intensities finds that differences of 0.025 A in the values of structural parameters may occur.
- DOE Contract Number:
- FG02-86ER45239
- OSTI ID:
- 6464989
- Journal Information:
- Physical Review, B: Condensed Matter; (United States), Journal Name: Physical Review, B: Condensed Matter; (United States) Vol. 48:3; ISSN PRBMDO; ISSN 0163-1829
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
360101* -- Metals & Alloys-- Preparation & Fabrication
360104 -- Metals & Alloys-- Physical Properties
AUGER ELECTRON SPECTROSCOPY
COHERENT SCATTERING
CRYSTALS
DIFFRACTION
ELECTRON DIFFRACTION
ELECTRON SPECTROSCOPY
ELEMENTS
FILMS
GOLD
GROWTH
INTERFACES
IRON
METALS
MONOCRYSTALS
SCATTERING
SPECTROSCOPY
THIN FILMS
TRANSITION ELEMENTS