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U.S. Department of Energy
Office of Scientific and Technical Information

Development of the Diffusion Bonding Process

Technical Report ·
DOI:https://doi.org/10.2172/7048303· OSTI ID:7048303
 [1];  [1]
  1. Mound Plant (MOUND), Miamisburg, OH (United States)
The diffusion bonding process was adapted for a unique low-temperature application involving the attachment of thin copper materials used in the flexible printed circuit industry. The work completed to date has demonstrated the feasibility of welding 0.0002-in. thick copper foil to 0.0014-in. thick oxygen-free, high-conductivity (OFHC) copper sheeting. The 0.0002-in. foil is an electrodeposited material on a Kapton substrate. The 0.0014-in. copper sheet is part of a cable assembly consisting of Kapton, epoxy, Pyralux adhesive, and additional copper layers. Heat must be applied through all these materials to effect welding at the interface. Diffusion bonding parameters of 5000 psi, a 3-min time period, and a weld interface temperature of 288°C (550°F) were found to form effective welds without causing appreciable degradation of the assembly, as shown by high voltage breakdown testing.
Research Organization:
Mound Plant (MOUND), Miamisburg, OH (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC04-76DP00053
OSTI ID:
7048303
Report Number(s):
MLM--3418; ON: DE87006598
Country of Publication:
United States
Language:
English