Soft x-ray photoemission characterization of the H sub 2 S exposed surface of p -InP

Journal Article · Mon Jun 15 04:00:00 EDT 1992 · Journal of Applied Physics; (United States)

DOI:https://doi.org/10.1063/1.350415· OSTI ID:7039296

Nelson, A J ^[1]; Frigo, S ^[2]; Rosenberg, R ^[3]

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1. National Renewable Energy Laboratories, 1617 Cole Boulevard, Golden, Colorado 80401 (United States)
2. Synchrotron Radiation Center, University of Wisconsin-Madison, 3731 Schneider Drive, Stoughton, Wisconsin 53589 (United States)
3. Argonne National Laboratory/Advanced Photon Source, 9700 South Cass Avenue, Argonne, Illinois 60439 (United States)

Synchrotron radiation soft x-ray photoemission spectroscopy was used to characterize the surface chemistry of {ital p}-InP before and after exposure to H{sub 2}S gas at ambient temperature. The effect of the H{sub 2}S dosing was determined by {ital in} {ital situ} photoemission measurements which were acquired after each gas exposure in order to observe changes in the valence band electronic structure as well as changes in the In 4{ital d}, P 2{ital p}, and S2{ital p} core lines. The results were used to correlate the surface chemistry to the electronic properties. These measurements indicate that the H{sub 2}S exposure type converts the {ital p}-type InP surface to an {ital n}-type surface and that the magnitude of the band bending is 0.6 eV resulting in a homojunction interface.

• DOE Contract Number: AC02-83CH10093
• OSTI ID: 7039296
• Journal Information: Journal of Applied Physics; (United States), Journal Name: Journal of Applied Physics; (United States) Vol. 71:12; ISSN 0021-8979; ISSN JAPIA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360606* -- Other Materials-- Physical Properties-- (1992-)
BREMSSTRAHLUNG
CHALCOGENIDES
CHEMICAL REACTIONS
ELECTROMAGNETIC RADIATION
EMISSION
HYDROGEN COMPOUNDS
HYDROGEN SULFIDES
INDIUM COMPOUNDS
INDIUM PHOSPHIDES
INTERFACES
IONIZING RADIATIONS
MATERIALS
P-TYPE CONDUCTORS
PHOSPHIDES
PHOSPHORUS COMPOUNDS
PHOTOEMISSION
PNICTIDES
RADIATIONS
SECONDARY EMISSION
SEMICONDUCTOR MATERIALS
SOFT X RADIATION
SULFIDES
SULFUR COMPOUNDS
SURFACE PROPERTIES
SYNCHROTRON RADIATION
X RADIATION