Composition-structure relationships for multisource evaporated CuGaSe/sub 2/ thin films

Journal Article · Mon Nov 14 23:00:00 EST 1988 · J. Appl. Phys.; (United States)

DOI:https://doi.org/10.1063/1.342439· OSTI ID:7014792

Albin, D; Noufi, R; Tuttle, J; Goral, J; Risbud, S H

X-ray diffraction (XRD) analysis of doublet formation and peak shifts were used to observe the compositional dependence of the order--disorder transition in polycrystalline CuGaSe/sub 2/ thin films deposited by multisource evaporation. Cu-poor material had a strong tendency to disorder as evidenced by the simultaneous presence of both the chalcopyrite and sphalerite phases. Stoichiometric and Cu-rich material contained only the tetragonal phase as observed by XRD. Comparison of Cu-poor XRD patterns with theoretical calculations reflecting probable defect chemistries (V/sub Cu/, Ga/sub Cu/, V/sub Se/) suggests an interesting microstructure. The absence of higher index group (iii) reflections, notably the (103) and (211) peaks, in chalcopyrite material suggest that the tetragonal phase maintains a near-stoichiometric composition. Overall Cu-poor film compositions may therefore be obtained by adjustment within the cubic phase which implies compositional segregation between the phases.

• Research Organization: Solar Energy Research Institute, Golden, Colorado 80401
• OSTI ID: 7014792
• Journal Information: J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 64:10; ISSN JAPIA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360603* -- Materials-- Properties
CHALCOGENIDES
CHEMICAL COMPOSITION
COHERENT SCATTERING
COPPER COMPOUNDS
COPPER SELENIDES
CRYSTAL LATTICES
CRYSTAL STRUCTURE
DIFFRACTION
FILMS
GALLIUM COMPOUNDS
GALLIUM SELENIDES
MICROSTRUCTURE
ORDER-DISORDER TRANSFORMATIONS
PHASE TRANSFORMATIONS
SCATTERING
SEGREGATION
SELENIDES
SELENIUM COMPOUNDS
TETRAGONAL LATTICES
THIN FILMS
TRANSITION ELEMENT COMPOUNDS
X-RAY DIFFRACTION