Microwave reflectometry for ICRF coupling studies on TFTR
- Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-8072 (United States)
- Plasma Physics Laboratory, Princeton University, P.O. Box 451, Princeton, New Jersey 08543 (United States)
A dual-frequency differential-phase reflectometer has been developed for use in ICRF power coupling studies on TFTR. This system has been optimized for measurements of the electron density profile in the edge-gradient region, where density fluctuations are large. Initial proof-of-principle measurements demonstrate that this is an effective way to measure the electron density profile in the plasma-edge region. A new reflectometer launcher is presently being installed on the center axis of the bay-K ICRF antenna on TFTR, along with the associated waveguide transmission line. This will allow direct measurement of the edge-density profile within the high-power-density environment of the ICRF antenna where density profile modification might be expected.
- DOE Contract Number:
- AC05-84OR21400
- OSTI ID:
- 7013941
- Report Number(s):
- CONF-9304112--
- Journal Information:
- AIP Conference Proceedings (American Institute of Physics); (United States), Journal Name: AIP Conference Proceedings (American Institute of Physics); (United States) Vol. 289:1; ISSN APCPCS; ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
700420* -- Fusion Technology-- Plasma-Facing Components-- (1992-)
ANTENNAS
CLOSED PLASMA DEVICES
COUPLING
ELECTRICAL EQUIPMENT
ELECTROMAGNETIC RADIATION
ELECTRON DENSITY
EQUIPMENT
HEATING
HIGH-FREQUENCY HEATING
ICR HEATING
MICROWAVE RADIATION
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
PLASMA
PLASMA HEATING
RADIATIONS
REFLECTIVITY
SURFACE PROPERTIES
TFTR TOKAMAK
THERMONUCLEAR DEVICES
TOKAMAK DEVICES
WAVEGUIDES