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Microwave reflectometry for ICRF coupling studies on TFTR

Conference · · AIP Conference Proceedings (American Institute of Physics); (United States)
OSTI ID:7013941
; ; ; ; ; ; ; ;  [1]; ;  [2]
  1. Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-8072 (United States)
  2. Plasma Physics Laboratory, Princeton University, P.O. Box 451, Princeton, New Jersey 08543 (United States)

A dual-frequency differential-phase reflectometer has been developed for use in ICRF power coupling studies on TFTR. This system has been optimized for measurements of the electron density profile in the edge-gradient region, where density fluctuations are large. Initial proof-of-principle measurements demonstrate that this is an effective way to measure the electron density profile in the plasma-edge region. A new reflectometer launcher is presently being installed on the center axis of the bay-K ICRF antenna on TFTR, along with the associated waveguide transmission line. This will allow direct measurement of the edge-density profile within the high-power-density environment of the ICRF antenna where density profile modification might be expected.

DOE Contract Number:
AC05-84OR21400
OSTI ID:
7013941
Report Number(s):
CONF-9304112--
Journal Information:
AIP Conference Proceedings (American Institute of Physics); (United States), Journal Name: AIP Conference Proceedings (American Institute of Physics); (United States) Vol. 289:1; ISSN APCPCS; ISSN 0094-243X
Country of Publication:
United States
Language:
English