Differential phase reflectometry for edge profile measurements on TFTR

Conference · Wed Jun 01 04:00:00 EDT 1994

OSTI ID:10160461

Hanson, G R; Wilgen, J B; Bigelow, T S; England, A C; Murakami, M; Rasmussen, D A ^[1]; Collazo, I ^[2]; Wilson, J R ^[3]

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1. Oak Ridge National Lab., TN (United States)
2. Georgia Inst. of Tech., Atlanta, GA (United States)
3. Princeton Univ., NJ (United States). Plasma Physics Lab.

Edge electron density profile measurements, including the scrape-off layer, have been made during ICRF heating with the two-frequency differential phase reflectometer installed in an ICRF antenna on TFTR. This system probes the plasma using the extraordinary mode with two signals swept from 90 to 118 GHz while maintaining a fixed difference frequency of 125 MHz. The extraordinary mode is used to obtain density profiles in the range of 1 {times} 10{sup 11} to 3 {times} 10{sup 13} cm{sup {minus}3} in high-field (4.5- to 4.9-T) full size (R{sub 0} = 2.62 m, a = .96 m) TFTR plasmas. The reflectometer launcher is located in an ICRF antenna and views the plasma through a small penetration in the center of the Faraday shield. A 26 m long overmoded waveguide run connects the launcher to the reflectometer microwave electronics. Profile measurements made with this reflectometer system will be presented along with a discussion of the characteristics of this differential phase reflectometer and data analysis.

• Research Organization: Oak Ridge National Lab., TN (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: AC05-84OR21400
• OSTI ID: 10160461
• Report Number(s): CONF-940552--9; ON: DE94013837
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
700320
ELECTRON DENSITY
ICR HEATING
MEASURING INSTRUMENTS
MEASURING METHODS
PLASMA DIAGNOSTIC TECHNIQUES AND INSTRUMENTATION
PLASMA DIAGNOSTICS
PLASMA SCRAPE-OFF LAYER
TFTR TOKAMAK