Microwave reflectometry for ICRF coupling studies on TFTR
- Oak Ridge National Lab., TN (United States)
- Oak Ridge Associated Universities, Inc., TN (United States)
- Georgia Inst. of Tech., Atlanta, GA (United States)
- Princeton Univ., NJ (United States). Plasma Physics Lab.
A dual-frequency differential-phase reflectometer has been developed for use in ICRF power coupling studies on TFTR. This system has been optimized for measurements of the electron density profile in the edge-gradient region, where density fluctuations are large. Initial proof-of-principle measurements demonstrate that this is an effective way to measure the electron density profile in the plasma-edge region. A new reflectometer launcher is presently being installed on the center axis of the bay-K ICRF antenna on TFTR, along with the associated waveguide transmission line. This will allow direct measurement of the edge-density profile within the high-power-density environment of the ICRF antenna where density modification might be expected.
- Research Organization:
- Princeton Univ., NJ (United States). Plasma Physics Lab.; Oak Ridge National Lab., TN (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC02-76CH03073; AC05-84OR21400
- OSTI ID:
- 10172820
- Report Number(s):
- PPPL--2915; CONF-9304112--21; ON: DE93016723
- Country of Publication:
- United States
- Language:
- English
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