Glancing angle EXAFS (Extended X-ray Absorption Fine Structure) studies of interfacial reactions: An application to Cu-Al thin films

Conference · Fri Jan 01 04:00:00 EST 1988

OSTI ID:7009078

Chen, H; Heald, S M

Interface problems are important to studies of reactivity of solids. Since interfaces are often buried, a non-destructive and sensitive probe capable of examining internal interfaces is desirable. A combination of the glancing angle x-ray reflectivity and Extended X-ray Absorption Fine Structure (EXAFS) has been shown to be such a technique. This paper describes the technique and its application to the determination of Cu-Al interface structures. Cu-Al system has been well studied by other techniques, such as Rutherford Backscattering (RBS) and X-ray Diffraction. Those studies identified CuAl/sub 2/ as the first compound to form at the interface. Using the glancing angle x-ray probe which has higher depth resolution, the initial interface structure was shown to be different from CuAl/sub 2/. This paper presents further results which show that as the result of annealing treatments, a thicker interface grows with a structure that resembles CuAl/sub 2/. 7 refs., 4 figs., 1 tab.

• Research Organization: Brookhaven National Lab., Upton, NY (USA)
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 7009078
• Report Number(s): BNL-41525; CONF-880623-1; ON: DE88015973
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360102* -- Metals & Alloys-- Structure & Phase Studies
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400101 -- Activation
Nuclear Reaction
Radiometric & Radiochemical Procedures
ALUMINIUM
ANNEALING
COHERENT SCATTERING
COPPER
DIFFRACTION
ELEMENTS
FILMS
FLUORESCENCE
HEAT TREATMENTS
INCIDENCE ANGLE
INTERFACES
LAYERS
LUMINESCENCE
METALS
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
REFLECTIVITY
REFRACTIVITY
SCATTERING
STRUCTURAL CHEMICAL ANALYSIS
SURFACE PROPERTIES
THIN FILMS
TRANSITION ELEMENTS
X-RAY DIFFRACTION