EXAFS and reflectivity studies of surfaces and interfaces using glancing angle x-rays

Conference · Wed Jan 01 04:00:00 EST 1986

OSTI ID:5510308

Heald, S M; Chen, H; Tranquada, J M

X-rays at glancing angles have a short controllable penetration depth which can be used to advantage in studying surfaces and interfaces. Data are presented for Cu-Al and Ag-Au bilayers which demonstrate the utility of x-ray reflectivity and extended x-ray absorption fine structure (EXAFS) measurements. X-ray reflectivity measurements are sensitive to layer thickness and interface roughness, while the EXAFS probes the atomic scale environment of the interface atoms. As the samples are annealed clear changes are observed in both techniques indicative of the growth of interfacial CuAl/sub 2/ for the Cu-Al samples and interdiffusion for Ag-Au. Interface sensitivity is verified for the Cu-Al samples by the observations that the EXAFS signal changes from Cu-like to CuAl/sub 2/-like with the growth of approx.100 A of CuAl/sub 2/. Quantitative fits to the x-ray reflectivity data are used to obtain interface roughness, and indicate that the growing CuAl/sub 2/ layer has a roughness comparable to its thickness. This is consistent with compound growth proceeding predominantly along grain boundaries.

• Research Organization: Brookhaven National Lab., Upton, NY (USA). Applied Science Dept.
• DOE Contract Number: AS05-80ER10742; AC02-76CH00016
• OSTI ID: 5510308
• Report Number(s): BNL-38364; CONF-860880-18; ON: DE86014171
• Country of Publication: United States
• Language: English

Related Subjects

440300* -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
ABSORPTION SPECTROSCOPY
ALUMINIUM
COPPER
ELEMENTS
FINE STRUCTURE
FLUORESCENCE
GOLD
INTERFACES
LUMINESCENCE
METALS
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
REFLECTIVITY
SILVER
SPECTROSCOPY
SURFACE PROPERTIES
TRANSITION ELEMENTS
X-RAY SPECTROSCOPY