X-ray reflection from novel multilayers with variable smoothness and figure: Final technical report for the period 1 April 1984-15 May 1986
Technical Report
·
OSTI ID:7003400
The theory of Bragg diffraction of soft x rays from thin-film multilayers has been refined and extended to include the effects of interfacial roughness and diffusion. This theory, together with a recently improved data base, has allowed the development of reliable design procedures for various multilayer applications. Different designs can emphasize peak reflectivity, high resolution, heat resistance, or other characteristics. Success has been achieved in the fabrication of heat-resistant multilayers and in producing controllably curved silicon substrates for multilayers.
- Research Organization:
- Brigham Young Univ., Provo, UT (USA)
- DOE Contract Number:
- AS08-84DP40199
- OSTI ID:
- 7003400
- Report Number(s):
- DOE/DP/40199-3; ON: DE87003907
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
440101* -- Radiation Instrumentation-- General Detectors or Monitors & Radiometric Instruments
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
BRAGG REFLECTION
COHERENT SCATTERING
DIFFRACTION
ELECTROMAGNETIC RADIATION
FILMS
INTERFACES
IONIZING RADIATIONS
LAYERS
RADIATIONS
REFLECTION
ROUGHNESS
SCATTERING
SOFT X RADIATION
SURFACE PROPERTIES
THIN FILMS
X RADIATION
X-RAY DIFFRACTION
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
BRAGG REFLECTION
COHERENT SCATTERING
DIFFRACTION
ELECTROMAGNETIC RADIATION
FILMS
INTERFACES
IONIZING RADIATIONS
LAYERS
RADIATIONS
REFLECTION
ROUGHNESS
SCATTERING
SOFT X RADIATION
SURFACE PROPERTIES
THIN FILMS
X RADIATION
X-RAY DIFFRACTION