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Concentration dependences of properties in the region of homogeneity of SnTe

Journal Article · · Inorg. Mater. (Engl. Transl.); (United States)
OSTI ID:6998030
; ; ;
This paper studies the concentration dependences of microhardness, thermo-emf, the x-ray line width, Hall constant, and the coefficient of thermo-emf within the region of homogeneity of SnTe. Special points have been found at a composition ca 50.4 at .% Te in the concentration-dependence curves of properties within the region of homogeneity of SnTe.
Research Organization:
V.I. Lenin Khar Kov Polytechic Institute
OSTI ID:
6998030
Journal Information:
Inorg. Mater. (Engl. Transl.); (United States), Journal Name: Inorg. Mater. (Engl. Transl.); (United States) Vol. 22:1; ISSN INOMA
Country of Publication:
United States
Language:
English

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Related Subjects

36 MATERIALS SCIENCE
360603* -- Materials-- Properties
CHALCOGENIDES
COHERENT SCATTERING
DIFFRACTION
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
ELECTROMOTIVE FORCE
HALL EFFECT
HARDNESS
LATTICE PARAMETERS
MECHANICAL PROPERTIES
MICROHARDNESS
PHYSICAL PROPERTIES
QUANTITY RATIO
SCATTERING
TELLURIDES
TELLURIUM COMPOUNDS
THERMOELECTRIC PROPERTIES
TIN COMPOUNDS
TIN TELLURIDES
X-RAY DIFFRACTION