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Grain-boundary edge passivation of GaAs films by selective anodization

Journal Article · · Appl. Phys. Lett.; (United States)
DOI:https://doi.org/10.1063/1.90513· OSTI ID:6983444

Solar cells built on polycrystalline gallium arsenide usually have very leaky reverse characteristics and, consequently, low open-circuit voltage. These problems arise from the effect of the Schottky diode made on the grain boundary, which behaves like n/sup +/-material. This diode shunts the active Schottky solar cell and deteriorates its performance characteristics. In this letter we describe the use of selective-anodization techniques to provide an insulating barrier over the edge of the grain boundary in order to passivate it. Leakage current reduction of 5--6 decades has been achieved by this method, with both aqueous and nonaqueous anodization methods.

Research Organization:
Electrical and Systems Engineering Department, Rensselaer Polytechnic Institute, Troy, New York 12181
OSTI ID:
6983444
Journal Information:
Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 33:8; ISSN APPLA
Country of Publication:
United States
Language:
English