Scanning tunnelling microscopy of platinum films on mica. Evolution of topography and crystallinity during film growth

Journal Article · Thu Jun 29 04:00:00 EDT 1989 · Journal of Physical Chemistry; (USA)

DOI:https://doi.org/10.1021/j100350a041· OSTI ID:6972549

Scott, E R; White, H S ^[1]; McClure, D J ^[2]

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1. Univ. of Minnesota, Minneapolis (USA)
2. 3M Corporate Research, St. Paul, MN (USA)

Scanning tunneling microscopy (STM) was used to characterize the topography and crystallinity of Pt films deposited on mica by rf sputtering. Three stages of film growth were identified by STM for films of thicknesses, d, between 20 and 1,500 {angstrom}. Images of ultrathin Pt films, d < 50 {angstrom}, show a rippled topography with no resolvable features associated with ordered crystalline growth. At intermediate coverages, 60 < d < 200 {angstrom}, 50-150-{angstrom}-diameter crystalline grains are resolved by STM. The shape and size of these grains are nearly identical with that observed by transmission electron microscopy. Large, flat grains (diameter {approx} 1,000 {angstrom}) with a nearly atomically smooth topography are observed for films of thickness {>=} 500 {angstrom}. STM images of Pt films immersed under water and in mineral oil and images of mobile surface contaminants are also reported.

• OSTI ID: 6972549
• Journal Information: Journal of Physical Chemistry; (USA), Journal Name: Journal of Physical Chemistry; (USA) Vol. 93:13; ISSN 0022-3654; ISSN JPCHA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360603* -- Materials-- Properties
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400201 -- Chemical &amp; Physicochemical Properties
CRYSTAL GROWTH
DATA
ELECTRON MICROSCOPY
ELEMENTS
EXPERIMENTAL DATA
FILMS
INFORMATION
MATERIALS
MEASURING INSTRUMENTS
MEASURING METHODS
METALS
MICA
MICROSCOPY
NUMERICAL DATA
PLATINUM
PLATINUM METALS
SCANNING ELECTRON MICROSCOPY
SEMICONDUCTOR MATERIALS
THIN FILMS
TOPOGRAPHY
TRANSITION ELEMENTS