A CMOS time to digital converter IC with 2 level analog CAM
Journal Article
·
· IEEE Journal of Solid-State Circuits (Institute of Electrical and Electronics Engineers); (United States)
- Univ. of Pennsylvania, Philadelphia, PA (United States)
- Katholieke Univ. Leuven (Belgium)
A time to charge converter IC with an analog memory unit (TCCAMU) has been designed and fabricated in HP's CMOS 1.2-[mu]m n-well process. The TCCAMU is an event driven system designed for front end data acquisition in high energy physics experiments. The chip includes a time to charge converter, analog Level 1 and Level 2 associative memories for input pipelining and data filtering, and an A/D converter. The intervals measured and digitized range from 8--24 ns. Testing of the fabricated chip resulted in an LSB width of 107 ps, a typical differential nonlinearity of < 35 ps, and a typical integral nonlinearity of < 200 ps. The average power dissipation is 8.28 mW per channel. By counting the reference clock, a time resolution of 107 ps over [approximately] 1 s range could be realized.
- OSTI ID:
- 6928227
- Journal Information:
- IEEE Journal of Solid-State Circuits (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Journal of Solid-State Circuits (Institute of Electrical and Electronics Engineers); (United States) Vol. 29:9; ISSN IJSCBC; ISSN 0018-9200
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
440104* -- Radiation Instrumentation-- High Energy Physics Instrumentation
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ANALOG-TO-DIGITAL CONVERTERS
DATA ACQUISITION SYSTEMS
DRIFT CHAMBERS
ELECTRONIC CIRCUITS
ELECTRONIC EQUIPMENT
ENERGY LOSSES
EQUIPMENT
FABRICATION
HIGH ENERGY PHYSICS
INTEGRATED CIRCUITS
LOSSES
MEASURING INSTRUMENTS
MICROELECTRONIC CIRCUITS
MULTIWIRE PROPORTIONAL CHAMBERS
PARTICLE IDENTIFICATION
PERFORMANCE TESTING
PHYSICS
POWER LOSSES
PROPORTIONAL COUNTERS
PULSE CIRCUITS
RADIATION DETECTORS
READOUT SYSTEMS
TESTING
TIME MEASUREMENT
TIME-OF-FLIGHT METHOD
TIMING CIRCUITS
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ANALOG-TO-DIGITAL CONVERTERS
DATA ACQUISITION SYSTEMS
DRIFT CHAMBERS
ELECTRONIC CIRCUITS
ELECTRONIC EQUIPMENT
ENERGY LOSSES
EQUIPMENT
FABRICATION
HIGH ENERGY PHYSICS
INTEGRATED CIRCUITS
LOSSES
MEASURING INSTRUMENTS
MICROELECTRONIC CIRCUITS
MULTIWIRE PROPORTIONAL CHAMBERS
PARTICLE IDENTIFICATION
PERFORMANCE TESTING
PHYSICS
POWER LOSSES
PROPORTIONAL COUNTERS
PULSE CIRCUITS
RADIATION DETECTORS
READOUT SYSTEMS
TESTING
TIME MEASUREMENT
TIME-OF-FLIGHT METHOD
TIMING CIRCUITS