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Improving the performance of InAs sub 1-x Sb sub x /InSb infrared detectors grown by metal organic chemical vapor deposition

Conference ·
OSTI ID:6925153

Diethylselenium and tetraethyltin were investigated as n-type dopants for InSb. Carrier concentrations between 6 {times} 10{sup 15} and 4 {times} 10{sup 18} cm{sup -3} with 77 K mobilities ranging from 75, 000 to 10,000 cm{sup 2}/Vs were achieved for Sn doped InSb. Triethylantimony and trimethylindium were used to grow InSb over the temperature range of 410 {minus} 470 C with a decrease in the p-type background occurring at 410 C. Diodes were prepared using tetraethyltin, trimethylindium and trimethylantimony at 470 C. The resulting current-voltage characteristics are improved over those of diodes grown previously using dimethyltellurium. SIMS measurements indicate a diffusion coefficient for Sn in InSb at 470 C that is approximately 1 {times} 10{sup -15} cm{sup 2}/s. 8 refs., 4 figs.

Research Organization:
Sandia National Labs., Albuquerque, NM (USA)
Sponsoring Organization:
DOE/DP
DOE Contract Number:
AC04-76DP00789
OSTI ID:
6925153
Report Number(s):
SAND-90-0088C; CONF-9006174--1; ON: DE90009743
Country of Publication:
United States
Language:
English