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Metalorganic chemical vapor deposition of InGaAsP/InP layers and fabrication of 1. 3-. mu. m planar buried heterostructure lasers

Journal Article · · J. Appl. Phys.; (United States)
DOI:https://doi.org/10.1063/1.341411· OSTI ID:6909829
High-quality InGaAsP and InP layers were obtained with good surface morphology by low-pressure metalorgainic chemical vapor deposition (MOCVD). The growth apparatus could be relatively simple using trimethylindium (TMI) as indium source. Abrupt heterointerfaces were also obtained and the compositional grading at the interfaces was estimated to be less than 20--30 A owing to the low-pressure growth technique. The selective burying growth on several types of mesas was investigated. The growth rate on the /111/B face was found to be smaller than that on the /111/A and the /100/ face in MOCVD. As a result, very smooth and flat varying layers were obtained when the rectangular mesas were formed along the <110> direction. Using these characteristics, low-threshold 1.3-..mu..m InGaAsP/InP lasers with planar buried heterostructures (PBH) were grown entirely by three-stage MOCVD. The threshold current I/sub th/ = 10 mA and the differential quantum efficiency eta/sub d/ = 60%, which are comparable to lasers grown by liquid-phase epitaxy, were obtained. PBH lasers with multi-quantum-well active layers were also fabricated. Continuous operation with threshold current I/sub th/ = 35 mA was achieved at room temperature.
Research Organization:
Optoelectronic Device Department, Matsushita Electronics Corporation, 1, Kohtari Yakemachi, Nagaokakyo, Kyoto 617, Japan
OSTI ID:
6909829
Journal Information:
J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 64:7; ISSN JAPIA
Country of Publication:
United States
Language:
English