Effect of mechanical stress on current-voltage characteristics of thin film polycrystalline diamond Schottky diodes

Journal Article · Mon Feb 15 04:00:00 EST 1993 · Journal of Applied Physics; (United States)

DOI:https://doi.org/10.1063/1.353168· OSTI ID:6905248

Zhao, G; Charlson, E M; Charlson, E J; Stacy, T; Meese, J M ^[1]; Popovici, G; Prelas, M ^[2]

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1. Department of Electrical and Computer Engineering, University of Missouri, Columbia, Missouri 65211 (United States)
2. Department of Nuclear Engineering, University of Missouri, Columbia, Missouri 65211 (United States)

Schottky diodes utilized for mechanical stress effect studies were fabricated using aluminum contacts to polycrystalline diamond thin films grown by a hot-filament-assisted chemical vapor deposition process. Compressive stress was found to have a large effect on the forward biased current-voltage characteristics of the diode, whereas the effect on the reverse biased characteristics was relatively small. This stress effect on the forward biased diamond Schottky diode was attributed to piezojunction and piezoresistance effects that dominated the diode current-voltage characteristics in the small and large bias regions, respectively. At a large constant forward bias current, a good linear relationship between output voltage and applied force was observed for force of less than 10 N, as predicted by the piezoresistance effect. The measured force sensitivity of the diode was as high as 0.75 V/N at 1 mA forward bias. Compared to either silicon or germanium junction diodes and tunnel diodes, polycrystalline diamond Schottky diodes not only are very stress sensitive but also have good linearity. This study shows polycrystalline diamond Schottky diodes have potential as mechanical sensors.

• DOE Contract Number: FG02-91ER12107
• OSTI ID: 6905248
• Journal Information: Journal of Applied Physics; (United States), Journal Name: Journal of Applied Physics; (United States) Vol. 73:4; ISSN JAPIAU; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360606* -- Other Materials-- Physical Properties-- (1992-)
ALUMINIUM
CARBON
CRYSTALS
DIAMONDS
ELECTRICITY
ELEMENTAL MINERALS
ELEMENTS
FILMS
METALS
MINERALS
NONMETALS
PIEZOELECTRICITY
POLYCRYSTALS
SCHOTTKY BARRIER DIODES
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
STRESSES
THIN FILMS