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Glow-discharge-implanted, thermally annealed, oxide-passivated silicon solar cells of 19% efficiency

Journal Article · · Appl. Phys. Lett.; (United States)
DOI:https://doi.org/10.1063/1.98176· OSTI ID:6886737
Single-crystal silicon solar cells with efficiencies as high as 19.3% AM1.5 have been fabricated using simple, glow-discharge ion implantation followed by conventional furnace annealing during which an oxide layer was grown for surface passivation. Fine-line (--5 ..mu..m) photolithography was used for metallization to reduce carrier recombination at the metal-silicon interface and optimized ZnS/MgF/sub 2/ antireflection coatings were applied. The efficiencies of these cells are the highest reported to date for ion-implanted cells.
Research Organization:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
DOE Contract Number:
AC05-84OR21400
OSTI ID:
6886737
Journal Information:
Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 50:8; ISSN APPLA
Country of Publication:
United States
Language:
English