Growth and characterization of c-axis oriented YBa{sub 2}Cu{sub 3}O{sub 7{minus}x}/PrBa{sub 2}Cu{sub 3}O{sub 7{minus}x} bilayers
Journal Article
·
· International Journal of Modern Physics B
- Univ. di Salerno, Baronissi (Italy)
- Forschungszentrum Juelich GmbH (Germany). Inst. fuer Festkoerprforschung
The authors report on the preparation and characterization of YBa{sub 2}Cu{sub 3}O{sub 7{minus}x}/PrBa{sub 2}Cu{sub 3}O{sub 7{minus}x} bilayers onto (100) SrTiO{sub 3} substrates. The samples have been prepared by sequential dc sputtering processes in high oxygen pressure from stoichiometric targets. The structural characterization of the YBa{sub 2}Cu{sub 3}O{sub 7{minus}x} and PrBa{sub 2}Cu{sub 3}O{sup 7{minus}x} films and of the bilayers has been performed by means of X-ray diffraction. The Scanning Electron Microscopy analysis has showed that the film surfaces are flat and free of precipitates. A detailed study of the interfaces has been performed by Transmission Electron Microscopy analysis. The electrical resistivity measurements showed for the YBa{sub 2}Cu{sub 3}O{sub 7{minus}x} films sharp superconducting transitions at 91.5 K and critical current density of about 10{sup 6} A/cm{sup 2} at 77 K, while for the PrBa{sub 2}Cu{sub 3}O{sub 7{minus}x} films a semiconductor-like behavior has been observed.
- OSTI ID:
- 687405
- Report Number(s):
- CONF-9810174--
- Journal Information:
- International Journal of Modern Physics B, Journal Name: International Journal of Modern Physics B Journal Issue: 9-10 Vol. 13; ISSN IJPBEV; ISSN 0217-9792
- Country of Publication:
- United States
- Language:
- English
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