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Growth and characterization of c-axis oriented YBa{sub 2}Cu{sub 3}O{sub 7{minus}x}/PrBa{sub 2}Cu{sub 3}O{sub 7{minus}x} bilayers

Journal Article · · International Journal of Modern Physics B
; ; ; ;  [1];  [2]
  1. Univ. di Salerno, Baronissi (Italy)
  2. Forschungszentrum Juelich GmbH (Germany). Inst. fuer Festkoerprforschung
The authors report on the preparation and characterization of YBa{sub 2}Cu{sub 3}O{sub 7{minus}x}/PrBa{sub 2}Cu{sub 3}O{sub 7{minus}x} bilayers onto (100) SrTiO{sub 3} substrates. The samples have been prepared by sequential dc sputtering processes in high oxygen pressure from stoichiometric targets. The structural characterization of the YBa{sub 2}Cu{sub 3}O{sub 7{minus}x} and PrBa{sub 2}Cu{sub 3}O{sup 7{minus}x} films and of the bilayers has been performed by means of X-ray diffraction. The Scanning Electron Microscopy analysis has showed that the film surfaces are flat and free of precipitates. A detailed study of the interfaces has been performed by Transmission Electron Microscopy analysis. The electrical resistivity measurements showed for the YBa{sub 2}Cu{sub 3}O{sub 7{minus}x} films sharp superconducting transitions at 91.5 K and critical current density of about 10{sup 6} A/cm{sup 2} at 77 K, while for the PrBa{sub 2}Cu{sub 3}O{sub 7{minus}x} films a semiconductor-like behavior has been observed.
OSTI ID:
687405
Report Number(s):
CONF-9810174--
Journal Information:
International Journal of Modern Physics B, Journal Name: International Journal of Modern Physics B Journal Issue: 9-10 Vol. 13; ISSN IJPBEV; ISSN 0217-9792
Country of Publication:
United States
Language:
English