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Crack formation in epitaxial (110) thin films of YBa sub 2 Cu sub 3 O sub 7 minus. delta. and PrBa sub 2 Cu sub 3 O sub 7 minus x on (110)SrTiO sub 3 substrates

Journal Article · · Applied Physics Letters; (USA)
DOI:https://doi.org/10.1063/1.105110· OSTI ID:5532208
; ; ;  [1];  [2]
  1. IBM Research Division, T.J. Watson Research Center, Yorktown Heights, New York 10598 (US)
  2. Materials Department, University of California, Santa Barbara, California, 93106 (US)

A characteristic feature of epitaxial (110) thin films of YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} and PrBa{sub 2}Cu{sub 3}O{sub 7{minus}{ital x}} on (110)SrTiO{sub 3} substrates is that the films have a tendency to crack along the (001) planes. We have studied the crack spacing as a function of deposition temperature and film thickness. The experimental data have been found to be in excellent agreement with a theoretical analysis of the crack spacings in brittle films. The study has allowed us to determine the critical thickness below which no cracks are expected to form as a function of temperature for (110) films of YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}}, PrBa{sub 2}Cu{sub 3}O{sub 7{minus}{ital x}}, and YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}}/ PrBa{sub 2}Cu{sub 3}O{sub 7{minus}{ital x}} bilayers.

OSTI ID:
5532208
Journal Information:
Applied Physics Letters; (USA), Journal Name: Applied Physics Letters; (USA) Vol. 58:15; ISSN APPLA; ISSN 0003-6951
Country of Publication:
United States
Language:
English