Multiple fault analysis in synchronous sequential circuits by means of vector Boolean difference
Conference
·
OSTI ID:6846874
The Boolean difference is an elegant mathematical concept which has found significant application in the study of single faults of a stuck-at nature in combinational logic circuits. Recently, several authors have extended this technique to the analysis of multiple faults in combinational circuits. The concept of vector Boolean difference is further extended to the analysis of multiple stuck-at faults in synchronous sequential circuits.
- Research Organization:
- Sandia Labs., Albuquerque, N.Mex. (USA)
- DOE Contract Number:
- EY-76-C-04-0789
- OSTI ID:
- 6846874
- Report Number(s):
- SAND-77-0702J; CONF-770891-1
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
42 ENGINEERING
420800* -- Engineering-- Electronic Circuits & Devices-- (-1989)
99 GENERAL AND MISCELLANEOUS
990200 -- Mathematics & Computers
ELECTRONIC CIRCUITS
FAULT TREE ANALYSIS
INTEGRATED CIRCUITS
LOGIC CIRCUITS
MICROELECTRONIC CIRCUITS
SEQUENTIAL CIRCUITS
SYSTEM FAILURE ANALYSIS
SYSTEMS ANALYSIS
420800* -- Engineering-- Electronic Circuits & Devices-- (-1989)
99 GENERAL AND MISCELLANEOUS
990200 -- Mathematics & Computers
ELECTRONIC CIRCUITS
FAULT TREE ANALYSIS
INTEGRATED CIRCUITS
LOGIC CIRCUITS
MICROELECTRONIC CIRCUITS
SEQUENTIAL CIRCUITS
SYSTEM FAILURE ANALYSIS
SYSTEMS ANALYSIS