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Title: Thin films of Y sub 1 Ba sub 2 Cu sub 3 O sub x deposited using three target CO-sputtering and their applications to microbridge junctions and single-element IR detectors

Conference · · AIP Conference Proceedings (American Institute of Physics); (USA)
OSTI ID:6837405
; ; ; ;  [1]; ; ;  [2]; ; ; ;  [3]
  1. Hughes Research Laboratories, Malibu, CA 90265 (USA)
  2. Hughes Microelectronics Center, Carlsbad, CA 92008-4835 (USA)
  3. Santa Barbara Research Center, Goleta, CA 93117-3090 (USA)

We have produced superconducting thin films of Y{sub 1}Ba{sub 2}Cu{sub 3}O{sub {ital x}} (YBCO) on SrTiO{sub 3}, ZrO{sub 2}(Y{sub 2} O{sub 3}), and Al{sub 2}O{sub 3} having T{sub c}'s of 90 K and sharp {Delta}T{sub c}'s (0.3 K for 90% to 10% on SrTiO{sub 3} and 3.3{times}10{sup 5} A/cm{sup 2} at 78 K). Samples were fabricated in a three target magnetron co-sputtering, computer controlled system using separate BaF{sub 2}, Y, and Cu targets. Rutherford backscatterng (RBS) and resistivity measurements showed that the thickness and composition uniformity was 99% across a 2-in.-diameter substrate. Films were deposited at room temperature and were subsequently annealed in wet O{sub 2} at 850 {degree}C for 1.0 hr. Analysis of the films by x-ray diffraction indicates highly oriented crystalline structure with a and c axes perpendicular to the substrate surface for (100) SrTiO{sub 3}, and randomly oriented Y{sub 1}Ba{sub 2}Cu{sub 3}O{sub {ital x}} polycrystalline structure for ZrO{sub 2} and Al{sub 2}O{sub 3}.

OSTI ID:
6837405
Report Number(s):
CONF-881035-; CODEN: APCPC; TRN: 90-017371
Journal Information:
AIP Conference Proceedings (American Institute of Physics); (USA), Vol. 182:1; Conference: Topical conference on high- Tc superconducting thin films, devices, and characterization, Atlanta, GA (USA), 3 Oct 1988; ISSN 0094-243X
Country of Publication:
United States
Language:
English