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Application of thermoluminescence-dosimetry (TLD) systems for determining absorbed dose in radiation-hardness testing of electronic devices

Book ·
OSTI ID:6828430
A standard practice is presented covering procedures for the use of thermoluminescent dosemeters to determine the absorbed dose in a material irradiated by ionizing radiation. The specific area of application is the radiation-hardness testing of electronic devices in which the material of interest is usually silicon. The method is applicable to measurement of absorbed dosed in material irradiated by gamma rays, x-rays and electrons of energies up to 60 MeV.
OSTI ID:
6828430
Report Number(s):
ANSI/ASTM-E-668-78
Country of Publication:
United States
Language:
English

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Related Subjects

440102 -- Radiation Instrumentation-- Radiation Dosemeters
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DOSEMETERS
DOSES
ELECTROMAGNETIC RADIATION
ELECTRONIC EQUIPMENT
ELEMENTS
EQUIPMENT
GAMMA RADIATION
HARDENING
IONIZING RADIATIONS
LUMINESCENT DOSEMETERS
MEASURING INSTRUMENTS
PHYSICAL RADIATION EFFECTS
RADIATION DOSES
RADIATION EFFECTS
RADIATION HARDENING
RADIATIONS
SEMIMETALS
SILICON
STANDARDS
TESTING
THERMOLUMINESCENT DOSEMETERS
USES
X RADIATION