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Thermoluminescence-dosimetry (TLD) systems for determining absorbed dose in radiation-hardness testing of electronic devices

Journal Article · · Annu. Book ASTM Stand.; (United States)
OSTI ID:5480846
The practice covers procedures for the use of thermoluminescence dosimeters to determine the absorbed dose in a material irradiated by ionizing radiation. The specific area of concern is radiation-hardness testing of electronic devices in which the material of interest is usually silicon. The practice is applicable to the measurement of absorbed dose in materials irradiated by gamma rays, x rays, and electrons of energies up to 60 MeV. The range of absorbed dose covered is approximately from 10/sup -2/ to 10/sup 4/ Gy (1 to 10/sup 12/ rad/s). The practice includes a discussion of apparatus, handling and readout procedures, requirements for performance testing, performance tests and correction factors, calibration, monitoring, and reporting results. Appendixes cover recommended procedures for application of CaF/sub 2/:Mn CHIPS, energy absorption coefficients and collision stopping powers, electron equilibrium thickness, and determination of test sample size. (JMT)
OSTI ID:
5480846
Journal Information:
Annu. Book ASTM Stand.; (United States), Journal Name: Annu. Book ASTM Stand.; (United States) Vol. 45; ISSN ABASC
Country of Publication:
United States
Language:
English