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Laser annealing of ion implanted silicon

Conference ·
OSTI ID:6825453
Pulsed laser annealing of ion implanted silicon leads to the formation of supersaturated alloys by nonequilibrium crystal growth processes at the interface occurring during liquid phase epitaxial regrowth. The interfacial distribution coefficients from the melt (k') and the maximum substitutional solubilities (C/sub s//sup max/) are far greater than equilibrium values. Both K' and C/sub s//sup max/ are functions of growth velocity. Mechanisms limiting substitutional solubilities are discussed. 5 figures, 2 tables.
Research Organization:
Oak Ridge National Lab., TN (USA); Motorola, Inc., Phoenix, AZ (USA)
DOE Contract Number:
W-7405-ENG-26
OSTI ID:
6825453
Report Number(s):
CONF-801111-17
Country of Publication:
United States
Language:
English