Atomic rearrangement at ZnTe/CdSe interfaces

Journal Article · Tue Nov 15 04:00:00 EST 1994 · Physical Review, B: Condensed Matter; (United States)

DOI:https://doi.org/10.1103/PhysRevB.50.14327· OSTI ID:6820610

Kemner, K M; Bunker, B A; Kropf, A J; Luo, H; Samarth, N; Furdyna, J K; Weidmann, M R; Newman, K E ^[1]

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1. Department of Physics, University of Notre Dame, Notre Dame, Indiana 46556 (United States)

X-ray-absorption fine-structure spectroscopy and x-ray diffraction have been used to study the local atomic structure of four different short-period ZnTe/CdSe (001) superlattices grown by molecular-beam epitaxy. The data indicate Zn-Se and Cd-Te coordination numbers greater than those expected for sharp interfaces in the superlattice. Although strain would appear to suppress interdiffusion, it is shown that the results are consistent with an interchange of the Zn and Cd atomic planes across the Zn-Se interface and Se and Te atomic planes across the Cd-Te interface. Theoretically, this switch of atomic planes has been shown to be energetically favorable by comparing the changes in chemical bond-formation energies and strain energies between a perfect superlattice and one with the above-mentioned switching of atomic planes. Accommodation of this strain is shown through bond bending and bond stretching at the newly formed interfaces.

• DOE Contract Number: AC02-76CH00016
• OSTI ID: 6820610
• Journal Information: Physical Review, B: Condensed Matter; (United States), Journal Name: Physical Review, B: Condensed Matter; (United States) Vol. 50:19; ISSN PRBMDO; ISSN 0163-1829
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360602* -- Other Materials-- Structure & Phase Studies
ABSORPTION SPECTRA
CADMIUM COMPOUNDS
CADMIUM SELENIDES
CHALCOGENIDES
COHERENT SCATTERING
CRYSTAL GROWTH
CRYSTAL STRUCTURE
DIFFRACTION
ELECTRON MICROSCOPY
EPITAXY
INTERFACES
MICROSCOPY
SCATTERING
SELENIDES
SELENIUM COMPOUNDS
SPECTRA
SUPERLATTICES
TELLURIDES
TELLURIUM COMPOUNDS
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION
X-RAY SPECTRA
ZINC COMPOUNDS
ZINC TELLURIDES