X-ray study of atomic correlations in Zn{sub 0.5}Cd{sub 0.5}Se{sub 0.5}Te{sub 0.5} epitaxial thin films

Journal Article · Tue Apr 01 04:00:00 EST 1997 · Physical Review, B: Condensed Matter

DOI:https://doi.org/10.1103/PhysRevB.55.9910· OSTI ID:560711

Lu, Q; Bunker, B A; Luo, H; Kropf, A J; Kemner, K M; Furdyna, J K ^[1]

---

1. Department of Physics, University of Notre Dame, Notre Dame, Indiana 46556 (United States)

X-ray absorption fine-structure spectroscopy (XAFS) measurements have been performed at approximately 90 K to study the local structure of II-VI quaternary alloy Zn{sub 0.5}Cd{sub 0.5}Se{sub 0.5}Te{sub 0.5}. Samples were grown by molecular beam epitaxy on (100) GaAs substrates, 4{degree} miscut towards the (111)B direction with a ZnTe buffer layer. The XAFS data indicate that there are more Zn-Se and Cd-Te bonds in the alloy than expected for a random arrangement. The results imply the formation of high-strain local structure and indicate that electronic pairing energies dominate over strain energy. These results are similar to the earlier observation of interlayer switching in ZnTe/CdSe superlattices. The preference of Zn-Se and Cd-Te bonding also implies a tendency to spontaneously form a composition-modulated microstructure. {copyright} {ital 1997} {ital The American Physical Society}

• OSTI ID: 560711
• Journal Information: Physical Review, B: Condensed Matter, Journal Name: Physical Review, B: Condensed Matter Journal Issue: 15 Vol. 55; ISSN PRBMDO; ISSN 0163-1829
• Country of Publication: United States
• Language: English

Related Subjects

66 PHYSICS
CADMIUM SELENIDES
CADMIUM TELLURIDES
CHEMICAL COMPOSITION
ELECTRONIC STRUCTURE
FINE STRUCTURE
GALLIUM ARSENIDES
MOLECULAR BEAM EPITAXY
SUPERLATTICES
X-RAY SPECTROSCOPY
ZINC SELENIDES
ZINC TELLURIDES