Extended x-ray-absorption fine-structure studies of interfaces in ZnTe/CdSe superlattices

Journal Article · Tue Sep 15 04:00:00 EDT 1992 · Physical Review, B: Condensed Matter; (United States)

DOI:https://doi.org/10.1103/PhysRevB.46.7272· OSTI ID:7266187

Kemner, K M; Bunker, B A; Luo, H; Samarth, N; Furdyna, J K; Weidmann, M R; Newman, K E ^[1]

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1. Department of Physics, University of Notre Dame, Notre Dame, Indiana 46556 (United States)

Polarization-dependent grazing incidence EXAFS, employing the electron yield technique, has been used to study the local atomic structure of two different short-period ZnTe/CdSe(001) superlattices grown by molecular-beam epitaxy. The data obtained for the Se edge at room temperature indicate Zn-Se and Cd-Te coordination numbers greater than those expected for sharp interfaces in the superlattice. Although strain would appear to suppress interdiffusion, we show that the results are consistent with an interchange of Zn and Cd atoms across the Zn-Se interface, and Se and Te atoms across the Cd-Te interface. We also discuss accommodation of this increased strain through bond bending and bond stretching.

• DOE Contract Number: AC02-76CH00016
• OSTI ID: 7266187
• Journal Information: Physical Review, B: Condensed Matter; (United States), Journal Name: Physical Review, B: Condensed Matter; (United States) Vol. 46:11; ISSN PRBMD; ISSN 0163-1829
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360602* -- Other Materials-- Structure & Phase Studies
BOND ANGLE
BOND LENGTHS
CADMIUM COMPOUNDS
CADMIUM SELENIDES
CHALCOGENIDES
COHERENT SCATTERING
CRYSTAL STRUCTURE
DIFFRACTION
DIFFUSION
DIMENSIONS
INTERFACES
LENGTH
SCATTERING
SELENIDES
SELENIUM COMPOUNDS
STRAINS
SUPERLATTICES
TELLURIDES
TELLURIUM COMPOUNDS
X-RAY DIFFRACTION
ZINC COMPOUNDS
ZINC TELLURIDES