Progress report on the use of hybrid silicon pin diode arrays in high energy physics

Technical Report · Tue May 01 04:00:00 EDT 1990

DOI:https://doi.org/10.2172/6812316· OSTI ID:6812316

Shapiro, S L ^[1]; Jernigan, J G; Arens, J F ^[2]

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1. Stanford Linear Accelerator Center, Menlo Park, CA (USA)
2. California Univ., Berkeley, CA (USA). Space Sciences Lab.

We report on the successful effort to develop hybrid PIN diode arrays and to demonstrate their potential as components of vertex detectors. Hybrid pixel arrays have been fabricated by the Hughes Aircraft Co. by bump-bonding readout chips developed by Hughes to an array of PIN diodes manufactured by Micron Semiconductor Inc. These hybrid pixel arrays were constructed in two configurations. One array format has 10 {times} 64 pixels, each 120 {mu}m square; and the other format has 256 {times} 156 pixels, each 30 {mu}m square. In both cases, the thickness of the PIN diode layer is 300 {mu}m. Measurements of detector performance show that excellent position resolution can be achieved by interpolation. By determining the centroid of the charge cloud which spreads charge into a number of neighboring pixels, a spatial resolution of a few microns has been attained. The noise has been measured to be about 300 electrons (rms) at room temperature, as expected from KTC and dark current considerations, yielding a signal-to-noise ratio of about 100 for minimum ionizing particles. 4 refs., 17 figs.

• Research Organization: Stanford Linear Accelerator Center, Menlo Park, CA (USA)
• Sponsoring Organization: DOE/ER
• DOE Contract Number: AC03-76SF00515
• OSTI ID: 6812316
• Report Number(s): SLAC-PUB-5212; ON: DE90011252
• Country of Publication: United States
• Language: English

Related Subjects

440104* -- Radiation Instrumentation-- High Energy Physics Instrumentation
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CHARGED PARTICLE DETECTION
DESIGN
DETECTION
DOCUMENT TYPES
ELECTRONIC CIRCUITS
MEASURING INSTRUMENTS
PROGRESS REPORT
RADIATION DETECTION
RADIATION DETECTORS
RESOLUTION
SEMICONDUCTOR DETECTORS
SI SEMICONDUCTOR DETECTORS
SPATIAL RESOLUTION
TESTING