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Ultrafast x-ray diffraction of laser-irradiated crystals

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.54601· OSTI ID:678724
;  [1]; ; ; ;  [2]; ;
  1. Advanced Light Source, Accelerator and Fusion Research Division, Lawrence Berkeley National Laboratory, Berkeley, California94720 (United States)
  2. Physics Department, University of California, Berkeley, California94720 (United States)

An apparatus has been developed for measuring time-dependent x-ray diffraction. X-ray pulses from an Advanced Light Source bend magnet are diffracted by a sagittally-focusing Si (111) crystal and then by a sample crystal, presently InSb (111). Laser pulses with 100 fs duration and a repetition rate of 1 KHz irradiate the sample inducing a phase transition. Two types of detectors are being employed: an x-ray streak camera and an avalanche photodiode. The streak camera is driven by a photoconductive switch and has a 2 ps temporal resolution determined by trigger jitter. The avalanche photodiode has high quantum efficiency and sufficient time resolution to detect single x-ray pulses in ALS two bunch or {open_quote}camshaft{close_quote} operation. A beamline is under construction dedicated for time resolved and micro-diffraction experiments. In the new beamline a toroidal mirror collects 3 mrad horizontally and makes a 1:1 image of the bend magnet source in the x-ray hutch. A laser induced phase transition has been observed in InSb occurring within 70 ps. {copyright} {ital 1997 American Institute of Physics.}

Sponsoring Organization:
USDOE
OSTI ID:
678724
Report Number(s):
CONF-9706157--
Journal Information:
AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 417; ISSN 0094-243X; ISSN APCPCS
Country of Publication:
United States
Language:
English

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