Ultrafast x-ray diffraction of laser-irradiated crystals

Journal Article · Tue Jul 01 00:00:00 EDT 1997 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.54601· OSTI ID:21179520

Heimann, P A; Padmore, H A ^[1]; Larsson, J; Lindenberg, A; Schuck, P J; Judd, E; Falcone, R W ^[2]; Chang, Z; Bucksbaum, P H; Murnane, M; Kapteyn, H ^[3]; Lee, R W ^[4]; Wark, J S ^[5]

---

1. Advanced Light Source, Accelerator and Fusion Research Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)
2. Physics Department, University of California, Berkeley, California 94720 (United States)
3. Center for Ultrafast Optical Science, University of Michigan, Ann Arbor, Michigan 48109 (United States)
4. Lawrence Livermore National Laboratory, Livermore, California 94551 (United States)
5. Department of Physics, Clarendon Laboratory, University of Oxford, Oxford OX1 3PU (United Kingdom)

An apparatus has been developed for measuring time-dependent x-ray diffraction. X-ray pulses from an Advanced Light Source bend magnet are diffracted by a sagittally-focusing Si (111) crystal and then by a sample crystal, presently InSb (111). Laser pulses with 100 fs duration and a repetition rate of 1 KHz irradiate the sample inducing a phase transition. Two types of detectors are being employed: an x-ray streak camera and an avalanche photodiode. The streak camera is driven by a photoconductive switch and has a 2 ps temporal resolution determined by trigger jitter. The avalanche photodiode has high quantum efficiency and sufficient time resolution to detect single x-ray pulses in ALS two bunch or 'camshaft' operation. A beamline is under construction dedicated for time resolved and micro-diffraction experiments. In the new beamline a toroidal mirror collects 3 mrad horizontally and makes a 1:1 image of the bend magnet source in the x-ray hutch. A laser induced phase transition has been observed in InSb occurring within 70 ps.

• OSTI ID: 21179520
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 417; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ADVANCED LIGHT SOURCE
BEAM EXTRACTION
CRYSTAL STRUCTURE
CRYSTALS
INDIUM ANTIMONIDES
KHZ RANGE
LASER MATERIALS
PHASE TRANSFORMATIONS
PHOTODETECTORS
QUANTUM EFFICIENCY
SILICON
STREAK CAMERAS
TIME DEPENDENCE
TIME RESOLUTION
X-RAY DETECTION
X-RAY DIFFRACTION