Ultrafast x-ray diffraction using a streak-camera detector in averaging mode

Journal Article · Tue Jul 01 00:00:00 EDT 1997 · Optics Letters

DOI:https://doi.org/10.1364/OL.22.001012· OSTI ID:589434

Larsson, J; Chang, Z; Judd, E; Schuck, P J; Falcone, R W ^[1]; Heimann, P A; Padmore, H A ^[2]; Kapteyn, H C; Bucksbaum, P H; Murnane, M M ^[3]; Lee, R W ^[4]; Machacek, A; Wark, J S ^[5]; Liu, X; Shan, B ^[6]

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1. Department of Physics, University of California, Berkeley, Berkeley, California 94720 (United States)
2. Advanced Light Source, Accelerator and Fusion Research Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)
3. Center for Ultrafast Optical Science, University of Michigan, Ann Arbor, Michigan 48109-2099 (United States)
4. Lawrence Livermore National Laboratory, Livermore, California 94551 (United States)
5. Department of Physics, Clarendon Laboratory, University of Oxford, Oxford OX1 3PU (United Kingdom)
6. Xi`an Institute of Optics and Precision Mechanics, Xi`an, 710000 (China)

We demonstrate an apparatus for measuring time-dependent x-ray diffraction. X-ray pulses from a synchrotron are diffracted by a pair of Si(111) crystals and detected with an x-ray streak camera that has single-shot resolution of better than 1ps. The streak camera is driven by a photoconductive switch, which is triggered by 100-fs laser pulses at a repetition rate of 1kHz. The laser and the streak camera are synchronized with the synchrotron pulses. In the averaging mode, trigger jitter results in 2-ps temporal resolution. We measured the duration of 5-keV pulses from the Advanced Light Source synchrotron to be 70ps. {copyright} {ital 1997} {ital Optical Society of America}

• OSTI ID: 589434
• Journal Information: Optics Letters, Journal Name: Optics Letters Journal Issue: 13 Vol. 22; ISSN 0146-9592; ISSN OPLEDP
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
ADVANCED LIGHT SOURCE
PULSE TECHNIQUES
RADIATION DETECTORS
STREAK CAMERAS
SYNCHROTRON RADIATION
TIME RESOLUTION
X-RAY DIFFRACTOMETERS