The full-use-of-suitable-spares (FUSS) approach to hardware reconfiguration for fault-tolerant processor arrays
Journal Article
·
· IEEE Transactions on Computers (Institute of Electrical and Electronics Engineers); (USA)
- Shell Development Company, Bellaire Research Center, Houston, TX (US)
- Purdue Univ., Lafayette, IN (USA). School of Electrical Engineering
A general approach to hardware reconfiguration is proposed for VLSI/WSI fault-tolerant processor arrays. The technique, called FUSS (full use of suitable spares), uses an indicator vector, the surplus vector, to guide the replacement of faulty processors within an array. Analytical study of the general FUSS algorithm shows that there is a linear relationship between the array size and the area of interconnect required for reconfiguration to be 100% successful.
- OSTI ID:
- 6782267
- Journal Information:
- IEEE Transactions on Computers (Institute of Electrical and Electronics Engineers); (USA), Journal Name: IEEE Transactions on Computers (Institute of Electrical and Electronics Engineers); (USA) Vol. 39:4; ISSN ITCOB; ISSN 0018-9340
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
42 ENGINEERING
426000 -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
99 GENERAL AND MISCELLANEOUS
990200* -- Mathematics & Computers
ALGORITHMS
ARRAY PROCESSORS
COMPUTER CODES
COMPUTERS
DESIGN
DIGITAL COMPUTERS
ELECTRONIC CIRCUITS
FAULT TOLERANT COMPUTERS
INTEGRATED CIRCUITS
MATHEMATICAL LOGIC
MICROELECTRONIC CIRCUITS
RELIABILITY
426000 -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
99 GENERAL AND MISCELLANEOUS
990200* -- Mathematics & Computers
ALGORITHMS
ARRAY PROCESSORS
COMPUTER CODES
COMPUTERS
DESIGN
DIGITAL COMPUTERS
ELECTRONIC CIRCUITS
FAULT TOLERANT COMPUTERS
INTEGRATED CIRCUITS
MATHEMATICAL LOGIC
MICROELECTRONIC CIRCUITS
RELIABILITY