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Title: Photoelectronic properties of II-VI heterojunctions. Progress report No. 2, April 1, 1977-February 28, 1978

Technical Report ·
OSTI ID:6765850

It is shown that ZnO thin films can be deposited either by rf sputtering or by spray pyrolysis and can be brought to the desired conductivity range for ZnO/CdTe heterojunction performance. First generation cells showed very high values of short-circuit current (19 mA/cm/sup 2/ for AM2 solar simulation); values of open-circuit voltage at least as large as 0.51 V have been obtained using ZnO films prepared by spray pyrolysis from ZnCl/sub 2/ solution. Solar efficiencies of 4.6% have been obtained in this preliminary research on the ZnO/CdTe cell. ITO/CdTe heterojunctions have been prepared by rf sputtering of ITO films; a solar efficiency of 8% was produced in the best cell corresponding to V/sub oc/ = 0.82 V and J/sub sc/ = 14.5 mA/cm/sup 2/. Initial transmission electron microscope pictures of ITO films have been made. ITO/CdTe cells exhibit degradation on heat treatment, and the mechanisms of degradation are of central interest. A correlation between Cu/sub 2/S/CdS heterojunction properties prepared on thin-film CdS with those prepared on single crystal CdS is under study. The preparation of indium-tin oxide films to be used as a back contact for the thin-film cells is discussed, and an apparatus is described for the preparation of both types of cells by the dry method, i.e., vacuum evaporation of CuCl followed by heat treatment to produce a Cu/sub 2/S/CdS junction. This method is much better suited than the dipping method for the comparison of thin-film and single crystal cells prepared under identical conditions. High quantum efficiency cells with open-circuit voltage in the 0.4 to 0.5 V range have been produced with single crystal substrates. (WHK)

Research Organization:
Stanford Univ., CA (USA). Dept. of Materials Science and Engineering
DOE Contract Number:
AT03-76ER70047
OSTI ID:
6765850
Report Number(s):
SU-DMS-77-R-4
Country of Publication:
United States
Language:
English