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Proton-induced single event upsets in the SBP9989 microprocessor. Final report

Technical Report ·
OSTI ID:6760282

This report describes the investigation of proton-induced single event upsets in the SBP9989 micro-processor fabricated by Texas Instruments, Inc. Ten different devices with various date codes were tested. Total dose failure occurred in five of these devices after 10 to the 12th power protons per sq cm. An average upset cross section of 6 times 10 to the minus 12th power upset-sq cm/proton-device was observed. Comparison with cosmic ray-induced upsets indicates that proton-induced upsets represent a more severe problem for satellites with orbits between 600 and 2500 nautical miles.

Research Organization:
Naval Research Lab., Washington, DC (USA)
OSTI ID:
6760282
Report Number(s):
AD-A-142448/0; NRL-MR-5213
Country of Publication:
United States
Language:
English

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