Proton-induced single event upsets in the SBP9989 microprocessor. Final report
Technical Report
·
OSTI ID:6760282
This report describes the investigation of proton-induced single event upsets in the SBP9989 micro-processor fabricated by Texas Instruments, Inc. Ten different devices with various date codes were tested. Total dose failure occurred in five of these devices after 10 to the 12th power protons per sq cm. An average upset cross section of 6 times 10 to the minus 12th power upset-sq cm/proton-device was observed. Comparison with cosmic ray-induced upsets indicates that proton-induced upsets represent a more severe problem for satellites with orbits between 600 and 2500 nautical miles.
- Research Organization:
- Naval Research Lab., Washington, DC (USA)
- OSTI ID:
- 6760282
- Report Number(s):
- AD-A-142448/0; NRL-MR-5213
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
BARYONS
COMPUTERS
COSMIC PROTONS
COSMIC RADIATION
CROSS SECTIONS
ELECTRONIC CIRCUITS
ELEMENTARY PARTICLES
FAILURES
FERMIONS
HADRONS
IONIZING RADIATIONS
MICROELECTRONIC CIRCUITS
MICROELECTRONICS
MICROPROCESSORS
NUCLEONS
ORBITS
PROTONS
RADIATION EFFECTS
RADIATIONS
SATELLITES
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
BARYONS
COMPUTERS
COSMIC PROTONS
COSMIC RADIATION
CROSS SECTIONS
ELECTRONIC CIRCUITS
ELEMENTARY PARTICLES
FAILURES
FERMIONS
HADRONS
IONIZING RADIATIONS
MICROELECTRONIC CIRCUITS
MICROELECTRONICS
MICROPROCESSORS
NUCLEONS
ORBITS
PROTONS
RADIATION EFFECTS
RADIATIONS
SATELLITES