Comparison between observed and theoretically determined SEU rates in the Texas TMS4416 DRAMs on-board the UoSAT-2 micro-satellite
Journal Article
·
· IEEE Transactions on Nuclear Science
- Univ. of Surrey, Guildford (United Kingdom). Centre for Satellite Engineering Research
A single event upset (SEU) prediction tool, PRISM (Protons in Semi-conductor Materials) has been used to model the proton induced upset rate in Texas TMS4416 DRAMs on-board the UoSAT-2 micro-satellite. Good agreement is found between the observed and theoretically determined SEU and MBU (multiple-bit upset) rates for this device.
- OSTI ID:
- 644165
- Report Number(s):
- CONF-970934--
- Journal Information:
- IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 3Pt3 Vol. 45; ISSN 0018-9499; ISSN IETNAE
- Country of Publication:
- United States
- Language:
- English
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