Enhancement of diffusion-induced grain boundary migration by ion irradiation
- Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
Diffusion-induced grain boundary migration (DIGM) was observed in Au/Cu bilayers irradiated with 1.5 MeV Kr at [ital T][ge]400 K. Rutherford backscattering spectrometry (RBS) showed nearly uniform distributions of Cu present throughout polycrystalline Au films after irradiation and after annealing treatments. Irradiation increased the amount of Cu relative to annealed-only areas. Cross-section transmission electron microscopy combined with x-ray energy dispersive spectroscopy (XEDS) identified alloyed zones (14--20 at. % Cu), confirming DIGM in the Au film of an ion bombarded bilayer. A description of DIGM is presented relating RBS measurements of the film-averaged Cu composition with treatment time, average grain size, and film thickness. Application of this model to the experimental results in combination with XEDS work indicates that irradiation enhances DIGM by increasing the grain boundary velocity.
- Research Organization:
- Argonne National Laboratory (ANL), Argonne, IL
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 6738954
- Journal Information:
- Applied Physics Letters; (United States), Vol. 62:14; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
GOLD
PHYSICAL RADIATION EFFECTS
CHEMICAL COMPOSITION
COPPER
DIFFUSION
FILMS
GRAIN BOUNDARIES
INTERFACES
ION BEAMS
MICROSTRUCTURE
POLYCRYSTALS
RUTHERFORD SCATTERING
TRANSMISSION ELECTRON MICROSCOPY
BEAMS
CRYSTAL STRUCTURE
CRYSTALS
ELASTIC SCATTERING
ELECTRON MICROSCOPY
ELEMENTS
METALS
MICROSCOPY
RADIATION EFFECTS
SCATTERING
TRANSITION ELEMENTS
360106* - Metals & Alloys- Radiation Effects
360102 - Metals & Alloys- Structure & Phase Studies