Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Bandgap energy pressure coefficients in strained-layer structures

Conference ·
OSTI ID:6727478
The hydrostatic-pressure coefficients of the bandgap energies for four different types of semiconductor heterojunction structures were obtained from photoluminescence measurements at 4K and pressures up to 4 kbar. The structures studied were n-type and p-type In/sub x/Ga/sub 1-x/As/GaAs and n-type GaAs/GaP/sub x/As/sub 1-x/ strained-layer superlattices, n-type In/sub x/Ga/sub 1-x/As/GaAs single strained quantum wells and an undoped GaAs/AlAs superlattice. The bandgap energies ranged from 1800 MeV for the GaAs/AlAS structure to 1280 MeV for the In/sub x/Ga/sub 1-x/As/GaAs single strained quantum wells. Pressure coefficients for the In/sub x/Ga/sub 1-x/As/GaAs and GaAs/GaP/sub x/As sub 1-x/ structures were found to be in the range of 10 to 12 MeV/kbar. However, the pressure coefficient of the luminescence energy from the GaAs/AlAs superlattice was found to be -2 MeV/kbar. This negative pressure coefficient is consistent with the interpretation that the luminescence is due to a transition between the construction-band X-point in the AlAs layers and the valence-band GAMMA-point in the GaAs layers.
Research Organization:
Sandia National Labs., Albuquerque, NM (USA)
DOE Contract Number:
AC04-76DP00789
OSTI ID:
6727478
Report Number(s):
SAND-87-0437C; CONF-870385-2; ON: DE87006713
Country of Publication:
United States
Language:
English