AMPLEX-SiCAL; A large dynamic range low-noise CMOS signal processor for silicon calorimeters
- CEA Saclay (France)
- European Organization for Nuclear Research, Geneva (Switzerland)
- IMEC, Leuven (Belgium)
- INFN, Piza (Italy)
- Surrey Univ., Guildford (United Kingdom)
This paper reports on an analog signal processor using commercial 3 [mu]m CMOS technology which has been designed and produced for the silicon luminosity calorimeter SiCAL of the ALEPH experiment. This processor is a modified version of the AMPLEX integrated circuit designed for the inner silicon detector of the UA-2 experiment. The output voltage swing has been increased to more than 5.5 Volt as required for the large dynamic range of 1000 MIPs or 3.8 pC[sup 2]. A fast analog summation, based on a neural network principle called follower aggregation, computes the average input charges for triggering purposes. The chip contains 16 channels, with a charge amplifier, shaper, track-and-hold stage, multiplexer, fast analog sum and a calibration system. The power consumption of the overall chip is 100 mW. The equivalent noise charge is less than 0.13MIP (0.5 fC rms) for a 50 pF detector capacitance, and the peaking time is about 250ns.
- OSTI ID:
- 6713035
- Report Number(s):
- CONF-911106--
- Journal Information:
- IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Vol. 39:4; ISSN 0018-9499; ISSN IETNAE
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
99 GENERAL AND MISCELLANEOUS
990200 -- Mathematics & Computers
AMPLIFIERS
ANALOG SYSTEMS
CALORIMETERS
DESIGN
ELECTRONIC CIRCUITS
ELECTRONIC EQUIPMENT
EQUIPMENT
HIGH ENERGY PHYSICS
INTEGRATED CIRCUITS
MEASURING INSTRUMENTS
MICROELECTRONIC CIRCUITS
MOS TRANSISTORS
NEURAL NETWORKS
PARALLEL PROCESSING
PHYSICS
PROGRAMMING
PULSE AMPLIFIERS
SEMICONDUCTOR DEVICES
TEST FACILITIES
TRANSISTORS